Retention mechanism of Cu-doped SiO2-based resistive memory

Published 2011 View Full Article

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Title
Retention mechanism of Cu-doped SiO2-based resistive memory
Authors
Keywords
-
Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 44, Issue 20, Pages 205103
Publisher
IOP Publishing
Online
2011-04-29
DOI
10.1088/0022-3727/44/20/205103

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