Morphological study on pentacene thin-film transistors: the influence of grain boundary on the electrical properties

Published 2010 View Full Article

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Title
Morphological study on pentacene thin-film transistors: the influence of grain boundary on the electrical properties
Authors
Keywords
-
Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 43, Issue 40, Pages 405103
Publisher
IOP Publishing
Online
2010-09-22
DOI
10.1088/0022-3727/43/40/405103

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