Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 42, Issue 17, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0022-3727/42/17/175307
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Funding
- ECFP7 [217257]
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We show that contrast analysis carried out by standard optical microscopy can be employed as a simple and quick technique to monitor the cleanness of graphene during the process steps required for device fabrication. Graphene flakes deposited by adhesive tape exfoliation can display a strong contrast increase upon processing, due to the organic contamination arising from the diffusion of glue residues over the samples. On the other hand, graphene deposited by an adhesive-free method, such as electrostatic deposition, does not show any contrast variation, suggesting a low degree of contamination. Therefore, the fabrication process of graphene-based devices may be monitored and optimized on the basis of an easy optical inspection.
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