Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage

Title
Unsupervised defect detection in textiles based on Fourier analysis and wavelet shrinkage
Authors
Keywords
-
Journal
APPLIED OPTICS
Volume 54, Issue 10, Pages 2963
Publisher
The Optical Society
Online
2015-03-29
DOI
10.1364/ao.54.002963

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