XPS Evidence for Negative Ion Formation in SIMS Depth Profiling of Organic Material with Cesium

Title
XPS Evidence for Negative Ion Formation in SIMS Depth Profiling of Organic Material with Cesium
Authors
Keywords
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Journal
Journal of Physical Chemistry C
Volume 118, Issue 46, Pages 26613-26620
Publisher
American Chemical Society (ACS)
Online
2014-10-30
DOI
10.1021/jp501851f

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