Temperature-Dependent Reduction of Epitaxial Ce1–xPrxO2−δ (x = 0–1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-ray Diffraction, X-ray Photoelectron Spectroscopy, and Raman Study

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Title
Temperature-Dependent Reduction of Epitaxial Ce1–xPrxO2−δ (x = 0–1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-ray Diffraction, X-ray Photoelectron Spectroscopy, and Raman Study
Authors
Keywords
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Journal
Journal of Physical Chemistry C
Volume 117, Issue 47, Pages 24851-24857
Publisher
American Chemical Society (ACS)
Online
2013-11-14
DOI
10.1021/jp4082867

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