Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 116, Issue 39, Pages 20722-20730Publisher
AMER CHEMICAL SOC
DOI: 10.1021/jp305739c
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Funding
- CNRS
- Region Nord-Pas de Calais [72837]
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We assess the performances of the transition voltage spectroscopy (TVS) method to determine the energies of the molecular orbitals involved in the electronic transport through molecular junctions. A large number of various molecular junctions made with alkyl chains but with different chemical structure of the electrode/molecule interfaces are studied. In the case of molecular junctions with clean, unoxidized electrode/molecule interfaces, that is, alkylthiols and alkenes directly grafted on Au and hydrogenated Si, respectively, we measure transition voltages in the range 0.9-1.4 V. We conclude that the TVS method allows estimating the onset of the tail of the LUMO density of states, at energy located 1.0-1.2 eV above the electrode Fermi energy. For oxidized interfaces (e.g., the same monolayer measured with Hg or eGaIn drops, or monolayers formed on a slightly oxidized silicon substrate), lower transition voltages (0.1-0.6 V) are systematically measured. These values are explained by the presence of oxide-related density of states at energies lower than the HOMO/LUMO of the molecules. As such, the TVS method is a useful technique to assess the quality of the molecule/electrode interfaces in molecular junctions.
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