Atomistic Simulation of Water Intrusion–Extrusion in ITQ-4 (IFR) and ZSM-22 (TON): The Role of Silanol Defects

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Title
Atomistic Simulation of Water Intrusion–Extrusion in ITQ-4 (IFR) and ZSM-22 (TON): The Role of Silanol Defects
Authors
Keywords
-
Journal
Journal of Physical Chemistry C
Volume 115, Issue 44, Pages 21942-21953
Publisher
American Chemical Society (ACS)
Online
2011-10-17
DOI
10.1021/jp207020w

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