Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy

Title
Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy
Authors
Keywords
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Journal
Journal of Physical Chemistry C
Volume 114, Issue 15, Pages 7161-7168
Publisher
American Chemical Society (ACS)
Online
2010-03-26
DOI
10.1021/jp1008797

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