ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis

Published 2010 View Full Article

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Title
ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single-Beam and Dual-Beam Analysis
Authors
Keywords
-
Journal
Journal of Physical Chemistry C
Volume 114, Issue 12, Pages 5565-5573
Publisher
American Chemical Society (ACS)
Online
2010-01-05
DOI
10.1021/jp9066179

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