Reaction of Various Reductants with Oxide Films on Pt Electrodes As Studied by the Surface Interrogation Mode of Scanning Electrochemical Microscopy (SI-SECM): Possible Validity of a Marcus Relationship

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Title
Reaction of Various Reductants with Oxide Films on Pt Electrodes As Studied by the Surface Interrogation Mode of Scanning Electrochemical Microscopy (SI-SECM): Possible Validity of a Marcus Relationship
Authors
Keywords
-
Journal
Journal of Physical Chemistry C
Volume 114, Issue 43, Pages 18645-18655
Publisher
American Chemical Society (ACS)
Online
2010-10-15
DOI
10.1021/jp107259h

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