Scanning Electron Microscopy for in Situ Monitoring of Semiconductor−Liquid Interfacial Processes: Electron Assisted Reduction of Ag Ions from Aqueous Solution on the Surface of TiO2 Rutile Nanowire

Title
Scanning Electron Microscopy for in Situ Monitoring of Semiconductor−Liquid Interfacial Processes: Electron Assisted Reduction of Ag Ions from Aqueous Solution on the Surface of TiO2 Rutile Nanowire
Authors
Keywords
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Journal
Journal of Physical Chemistry C
Volume 114, Issue 40, Pages 17233-17237
Publisher
American Chemical Society (ACS)
Online
2010-08-31
DOI
10.1021/jp1044546

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