Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate

Published 2010 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate
Authors
Keywords
-
Journal
Journal of Physical Chemistry C
Volume 114, Issue 43, Pages 18474-18480
Publisher
American Chemical Society (ACS)
Online
2010-10-08
DOI
10.1021/jp103795c

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.