An in Situ Synchrotron-Based Soft X-ray Microscopy Investigation of Ni Electrodeposition in a Thin-Layer Cell

Published 2009 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
An in Situ Synchrotron-Based Soft X-ray Microscopy Investigation of Ni Electrodeposition in a Thin-Layer Cell
Authors
Keywords
-
Journal
Journal of Physical Chemistry C
Volume 113, Issue 22, Pages 9783-9787
Publisher
American Chemical Society (ACS)
Online
2009-05-06
DOI
10.1021/jp901528g

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.