Sudden stress relaxation in compound semiconductor thin films triggered by secondary phase segregation

Numerical reactive diffusion modeling of stacked elemental layer rapid thermal annealed chalcopyrite absorber layer formation

(2015) André Zweschke et al.   THIN SOLID FILMS

A one-dimensional Fickian model to predict the Ga depth profiles in three-stage Cu(In,Ga)Se2

(2014) H. Rodriguez-Alvarez et al.   JOURNAL OF APPLIED PHYSICS

Compositional investigation of potassium doped Cu(In,Ga)Se2solar cells with efficiencies up to 20.8%

(2014) Philip Jackson et al.   Physica Status Solidi-Rapid Research Letters

Recrystallization of Cu(In,Ga)Se2 thin films studied by X-ray diffraction

(2013) H. Rodriguez-Alvarez et al.   ACTA MATERIALIA

Potassium-induced surface modification of Cu(In,Ga)Se2 thin films for high-efficiency solar cells

(2013) Adrian Chirilă et al.   NATURE MATERIALS

Formation of CuInSe2and CuGaSe2Thin-Films Deposited by Three-Stage Thermal Co-Evaporation: A Real-Time X-Ray Diffraction and Fluorescence Study

(2013) Humberto Rodriguez-Alvarez et al.   Advanced Energy Materials

Copper ion liquid-like thermoelectrics

(2012) Huili Liu et al.   NATURE MATERIALS

Mechanism of stress relaxation in nanocrystalline Fe-N thin films

(2012) Ranjeeta Gupta et al.   PHYSICAL REVIEW B

Electrostatic Potentials at Cu(In,Ga)Se2Grain Boundaries: Experiment and Simulations

(2012) Sebastian S. Schmidt et al.   PHYSICAL REVIEW LETTERS

Direct Insight into Grain Boundary Reconstruction in PolycrystallineCu(In,Ga)Se2with Atomic Resolution

(2012) Daniel Abou-Ras et al.   PHYSICAL REVIEW LETTERS

Influence of copper excess on the absorber quality of CuInSe2

(2011) Levent Gütay et al.   APPLIED PHYSICS LETTERS

Comprehensive insights into point defect and defect cluster formation in CuInSe2

(2011) Christiane Stephan et al.   APPLIED PHYSICS LETTERS

In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x-ray fluorescence and diffraction

(2011) R. Mainz et al.   JOURNAL OF APPLIED PHYSICS

Long-range structure of Cu(InxGa1−x)3Se5: A complementary neutron and anomalous x-ray diffraction study

(2011) S. Lehmann et al.   JOURNAL OF APPLIED PHYSICS

Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

(2011) Ch Genzel et al.   JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN

Investigation of Cu(In,Ga)Se2thin-film formation during the multi-stage co-evaporation process

(2011) R. Caballero et al.   PROGRESS IN PHOTOVOLTAICS

Recrystallization of CIGSe layers grown by three-step processes: A model based on grain boundary migration

(2010) N. Barreau et al.   ACTA MATERIALIA

Atomistic simulation of hillock growth

(2010) T. Frolov et al.   ACTA MATERIALIA

Recrystallization of Cu–In–S thin films studiedin situby energy-dispersive X-ray diffraction

(2010) Humberto Rodriguez-Alvarez et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Advanced diagnostic and control methods of processes and layers in CIGS solar cells and modules

(2010) Roland Scheer et al.   PROGRESS IN PHOTOVOLTAICS

Examination of growth kinetics of copper rich Cu(In,Ga)Se2-films using synchrotron energy dispersive X-ray diffractometry

(2010) Thorsten Rissom et al.   SOLAR ENERGY MATERIALS AND SOLAR CELLS

Compressive Stress Generation in Sn Thin Films and the Role of Grain Boundary Diffusion

(2009) Jae Wook Shin et al.   PHYSICAL REVIEW LETTERS

Experimental Observations of Stress-Driven Grain Boundary Migration

(2009) T. J. Rupert et al.   SCIENCE