High resolution X-ray Photoelectron Spectroscopy (XPS) study of K2O–SiO2 glasses: Evidence for three types of O and at least two types of Si

Published 2011 View Full Article

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Title
High resolution X-ray Photoelectron Spectroscopy (XPS) study of K2O–SiO2 glasses: Evidence for three types of O and at least two types of Si
Authors
Keywords
-
Journal
JOURNAL OF NON-CRYSTALLINE SOLIDS
Volume 358, Issue 2, Pages 290-302
Publisher
Elsevier BV
Online
2011-10-27
DOI
10.1016/j.jnoncrysol.2011.09.027

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