4.4 Article

Thermography and electroluminescence imaging of scribing failures in Cu(In,Ga)Se2 thin film solar modules

Journal

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/pssa.201532322

Keywords

Cu(In,Ga)Se-2; electroluminescence; lock-in thermography; scribing; solar modules; thin film

Funding

  1. Federal Ministry for the Environment, Nature Conservation, and Nuclear Safety Research (BMU) within the Photovoltaics Innovations Alliance [0325305C]

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Intentionally implemented scribing failures in Cu(In,Ga)Se-2 modules are studied using electroluminescence (EL) and dark lock-in thermography (DLIT). While the EL images do not allow a non-ambiguous defect distinction, the DLIT images reveal characteristic defect patterns for each defect type. In order to explain the DLIT defect appearance, we model and simulate the scribing defects in a network simulation model. The simulations yield characteristic current flow patterns for each scribing defect type and thus aid in the understanding and interpretation of the measurements. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

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