Long-term reliability of Al2O3and Parylene C bilayer encapsulated Utah electrode array based neural interfaces for chronic implantation

Published 2014 View Full Article

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Title
Long-term reliability of Al2O3and Parylene C bilayer encapsulated Utah electrode array based neural interfaces for chronic implantation
Authors
Keywords
-
Journal
Journal of Neural Engineering
Volume 11, Issue 2, Pages 026016
Publisher
IOP Publishing
Online
2014-03-24
DOI
10.1088/1741-2560/11/2/026016

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