Corrosion of silicon integrated circuits and lifetime predictions in implantable electronic devices

Published 2013 View Full Article

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Title
Corrosion of silicon integrated circuits and lifetime predictions in implantable electronic devices
Authors
Keywords
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Journal
Journal of Neural Engineering
Volume 10, Issue 3, Pages 031002
Publisher
IOP Publishing
Online
2013-05-20
DOI
10.1088/1741-2560/10/3/031002
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