Recombination-tunneling conduction in Cu- and S-doped ZnO nanorods’ core–shell junction: dependence of diode parameters on thermal annealing temperature and role of interfacial defects

Title
Recombination-tunneling conduction in Cu- and S-doped ZnO nanorods’ core–shell junction: dependence of diode parameters on thermal annealing temperature and role of interfacial defects
Authors
Keywords
<em class=EmphasisTypeItalic >n</em>-ZnO/<em class=EmphasisTypeItalic >p</em>-CuS, NRs’core–shell heterojunction, Diode parameters, Recombination-tunneling mechanism
Journal
JOURNAL OF NANOPARTICLE RESEARCH
Volume 16, Issue 1, Pages -
Publisher
Springer Nature
Online
2013-12-06
DOI
10.1007/s11051-013-2184-2

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now