Structure and electrical transport in films of Ge nanoparticles embedded in SiO2 matrix
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Title
Structure and electrical transport in films of Ge nanoparticles embedded in SiO2 matrix
Authors
Keywords
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Journal
JOURNAL OF NANOPARTICLE RESEARCH
Volume 14, Issue 7, Pages -
Publisher
Springer Nature
Online
2012-06-18
DOI
10.1007/s11051-012-0930-5
References
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Related references
Note: Only part of the references are listed.- High-efficiency silicon-compatible photodetectors based on Ge quantum dots
- (2011) S. Cosentino et al. APPLIED PHYSICS LETTERS
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- (2011) Magdalena Lidia Ciurea et al. JOURNAL OF APPLIED PHYSICS
- Electrical properties of conductive Ge nanocrystal thin films fabricated by low temperaturein situgrowth
- (2011) B Zhang et al. NANOTECHNOLOGY
- Growth and characterization of nc-Ge prepared by microwave annealing
- (2011) N. Srinivasa Rao et al. VACUUM
- Low-temperature fabrication of layered self-organized Ge clusters by RF-sputtering
- (2011) Sara RC Pinto et al. Nanoscale Research Letters
- Surface states induced high P-type conductivity in nanostructured thin film composed of Ge nanocrystals in SiO2 matrix
- (2010) B. Zhang et al. APPLIED PHYSICS LETTERS
- Size controlled synthesis of Ge nanocrystals in SiO2 at temperatures below 400 °C using magnetron sputtering
- (2010) B. Zhang et al. APPLIED PHYSICS LETTERS
- Ferromagnetism in Ge/SiO2 multilayer films
- (2010) Congmian Zhen et al. JOURNAL OF APPLIED PHYSICS
- Effects influencing electron and hole retention times in Ge nanocrystal memory structures operating in the direct tunneling regime
- (2010) R. Peibst et al. JOURNAL OF APPLIED PHYSICS
- Structural investigations of Ge nanoparticles embedded in an amorphous SiO2 matrix
- (2010) Ionel Stavarache et al. JOURNAL OF NANOPARTICLE RESEARCH
- Ge nanocrystals embedded in SiO2 in MOS based radiation sensors
- (2010) Aliekber Aktağ et al. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
- Pressure-induced phase transitions in amorphous and metastable crystalline germanium by Raman scattering, x-ray spectroscopy, andab initiocalculations
- (2009) F. Coppari et al. PHYSICAL REVIEW B
- Morphology of Si nanocrystallites embedded in SiO2 matrix
- (2008) V.S. Teodorescu et al. JOURNAL OF MATERIALS RESEARCH
- Stress Tuning of Ge Nanocrystals Embedded in Dielectrics
- (2008) F. Zheng et al. Journal of Physical Chemistry C
- Fabrication of multilayered Ge nanocrystals by magnetron sputtering and annealing
- (2008) Fei Gao et al. NANOTECHNOLOGY
- Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals
- (2007) P. Basa et al. APPLIED SURFACE SCIENCE
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