Journal
JOURNAL OF MICROSCOPY
Volume 246, Issue 1, Pages 77-82Publisher
WILEY-BLACKWELL
DOI: 10.1111/j.1365-2818.2011.03589.x
Keywords
FIB-SEM; filler dispersion; microstructure; rubber; silica; silane
Categories
Funding
- Sibelco
Ask authors/readers for more resources
A focused ion beamscanning electron microscope (FIBSEM) technique for three-dimensional reconstruction and representation of material microstructures was applied to a silica-filled synthetic rubber for the first time. Backscattered electron imaging allowed differentiation between rubber matrix, silica filler and zinc oxide (used as an activator for the sulphur vulcanisation reaction). Subsequent image processing allowed three-dimensional isosurface model generation of the particulate structure within the rubber composite and separation of zinc oxide from the silica filler. The potential for development and application of this technique using finite element analysis modelling is also highlighted.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available