Stress imagining of semiconductor surface by tip-enhanced Raman spectroscopy

Published 2008 View Full Article

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Title
Stress imagining of semiconductor surface by tip-enhanced Raman spectroscopy
Authors
Keywords
-
Journal
JOURNAL OF MICROSCOPY
Volume 229, Issue 2, Pages 217-222
Publisher
Wiley
Online
2008-02-26
DOI
10.1111/j.1365-2818.2008.01889.x

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