An argument for proof testing brittle microsystems in high-reliability applications

Title
An argument for proof testing brittle microsystems in high-reliability applications
Authors
Keywords
-
Journal
JOURNAL OF MICROMECHANICS AND MICROENGINEERING
Volume 18, Issue 11, Pages 117001
Publisher
IOP Publishing
Online
2008-10-11
DOI
10.1088/0960-1317/18/11/117001

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