Journal
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
Volume 19, Issue 4, Pages 774-784Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JMEMS.2010.2055544
Keywords
Electrostatic actuation; evanescent-mode cavity; microelectromechanical systems (MEMS); quality factor; tunable filter; tunable resonator; tuning
Categories
Funding
- Defense Advanced Research Projects Agency
- BAE Systems
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This paper presents the modeling, design, fabrication, and measurement of microelectromechanical systems-enabled continuously tunable evanescent-mode electromagnetic cavity resonators and filters with very high unloaded quality factors (Q(u)). Integrated electrostatically actuated thin diaphragms are used, for the first time, for tuning the frequency of the resonators/filters. An example tunable resonator with 2.6 : 1 (5.0-1.9 GHz) tuning ratio and Q(u) of 300-650 is presented. A continuously tunable two-pole filter from 3.04 to 4.71 GHz with 0.7% bandwidth and insertion loss of 3.55-2.38 dB is also shown as a technology demonstrator. Mechanical stability measurements show that the tunable resonators/filters exhibit very low frequency drift (less than 0.5% for 3 h) under constant bias voltage. This paper significantly expands upon previously reported tunable resonators. [2010-0033]
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