Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis
Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis
Authors
Keywords
Atomic Force Microscopy, Fractal Dimension, Root Mean Square, Fractal Analysis, Sapphire Substrate
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