A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry

Published 2009 View Full Article

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Title
A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry
Authors
Keywords
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Journal
JOURNAL OF MATERIALS SCIENCE
Volume 45, Issue 5, Pages 1411-1418
Publisher
Springer Nature
Online
2009-12-17
DOI
10.1007/s10853-009-4103-6
References
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