In situ methods to explore microstructure evolution in chemically derived oxide thin films

Published 2010 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
In situ methods to explore microstructure evolution in chemically derived oxide thin films
Authors
Keywords
-
Journal
JOURNAL OF MATERIALS RESEARCH
Volume 25, Issue 03, Pages 427-436
Publisher
Cambridge University Press (CUP)
Online
2010-02-24
DOI
10.1557/jmr.2010.0066

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.