Atomic migration in eutectic SnBi solder alloys due to current stressing

Title
Atomic migration in eutectic SnBi solder alloys due to current stressing
Authors
Keywords
-
Journal
JOURNAL OF MATERIALS RESEARCH
Volume 23, Issue 04, Pages 1051-1056
Publisher
Cambridge University Press (CUP)
Online
2008-04-01
DOI
10.1557/jmr.2008.0128

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