Compromise of electrical leakage and capacitance density effects: a facile route for high mobility and sharp subthreshold slope in low-voltage operable organic field-effect transistors

Title
Compromise of electrical leakage and capacitance density effects: a facile route for high mobility and sharp subthreshold slope in low-voltage operable organic field-effect transistors
Authors
Keywords
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Journal
JOURNAL OF MATERIALS CHEMISTRY
Volume 21, Issue 4, Pages 998-1004
Publisher
Royal Society of Chemistry (RSC)
Online
2010-11-12
DOI
10.1039/c0jm02401e

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