Journal
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume 321, Issue 20, Pages 3406-3410Publisher
ELSEVIER
DOI: 10.1016/j.jmmm.2009.06.018
Keywords
Diluted magnetic semiconductor; Sol-gel method; Ferromagnetism
Funding
- Science and Technology Planning Project of Guangdong Province of China [2006A11001002]
- Natural Science Foundation of Guangdong Province of China [8151027501000068]
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Thin films of Zn1-xMnxO (x = 0.01) diluted magnetic semiconductor were prepared on Si (100) substrates by the sol-gel method. The influence of annealing temperature on the structural, optical and magnetic properties was studied by X-ray diffraction (XRD), atom force microscopy (AFM), photoluminescence (PL) and SQUID magnetometer (MPMS, Quantum Design). The XRD spectrum shows that all the films are single crystalline with (002) preferential orientation along c-axis, indicating there are not any secondary phases. The atomic force microscopy images show the surfaces morphologies change greatly with an increase in annealing temperature. PL spectra reveal that the films marginally shift the near band-edge (NBE) position due to stress. The magnetic measurements of the films using SQUID clearly indicate the room temperature ferromagnetic behavior, and the Curie temperature of the samples is above room temperature. X-ray photoelectron spectroscopy (XPS) patterns suggest that Mn2+ ions were successfully incorporated into the lattice position of Zn2+ ions in ZnO host. It is also found that the post-annealing treatment can affect the ferromagnetic behavior of the films effectively. (C) 2009 Elsevier B.V. All rights reserved.
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