On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography

Published 2008 View Full Article

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Title
On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography
Authors
Keywords
-
Journal
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume 321, Issue 8, Pages 935-943
Publisher
Elsevier BV
Online
2008-03-11
DOI
10.1016/j.jmmm.2008.03.014

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