3.8 Article

Test generation from P systems using model checking

Journal

JOURNAL OF LOGIC AND ALGEBRAIC PROGRAMMING
Volume 79, Issue 6, Pages 350-362

Publisher

ELSEVIER SCIENCE INC
DOI: 10.1016/j.jlap.2010.03.007

Keywords

P systems; Kripke structures; Model checking; Test generation

Categories

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Funding

  1. CNCSIS - UEFISCSU [PNII - IDEI 643/2008]

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This paper presents some testing approaches based on model checking and using different testing criteria. First, test sets are built from different Kripke structure representations. Second, various rule coverage criteria for transitional, non-deterministic, cell-like P systems, are considered in order to generate adequate test sets. Rule based coverage criteria (simple rule coverage, context-dependent rule coverage and variants) are defined and, for each criterion, a set of LTL (Linear Temporal Logic) formulas is provided. A codification of a P system as a Kripke structure and the sets of LTL properties are used in test generation: for each criterion, test cases are obtained from the counterexamples of the associated LTL formulas, which are automatically generated from the Kripke structure codification of the P system. The method is illustrated with an implementation using a specific model checker, NuSMV. (C) 2010 Elsevier Inc. All rights reserved.

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