Optical Waveform Sampling and Error-Free Demultiplexing of 1.28 Tb/s Serial Data in a Nanoengineered Silicon Waveguide

Authors

Keywords

Journal

Volume 29, Issue 4, Pages 426-431

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2010-12-22

DOI

10.1109/jlt.2010.2100368

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