Correlation of Scattering Loss, Sidewall Roughness and Waveguide Width in Silicon-on-Insulator (SOI) Ridge Waveguides

Published 2009 View Full Article

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Title
Correlation of Scattering Loss, Sidewall Roughness and Waveguide Width in Silicon-on-Insulator (SOI) Ridge Waveguides
Authors
Keywords
-
Journal
JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume 27, Issue 18, Pages 3999-4008
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-04-29
DOI
10.1109/jlt.2009.2021562

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