Journal
JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume 26, Issue 21-24, Pages 3794-3802Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JLT.2008.2004957
Keywords
Disorder; optical low-coherence reflectometry (OLCR); photonic crystal; slow light
Funding
- Agence Nationale de la Recherche [L2CP]
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We investigate the impact of disorder on the propagation of photonic crystal waveguide modes using phase-sensitive optical low-coherence reflectometry. Combined with a suitable numerical processing, this technique reveals a considerable amount of information that we cast as time-wavelength reflectance maps. By comparing measurements on different samples, we easily identify inter-mode scattering and propagation losses mediated by slow leaky modes. We also characterize the dispersive behaviour of point defects. Our results verify previous theoretical predictions about the general group velocity scaling of losses and the dominant role of backscattering.
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