Mini–max regret strategy for robust capacity expansion decisions in semiconductor manufacturing

Title
Mini–max regret strategy for robust capacity expansion decisions in semiconductor manufacturing
Authors
Keywords
-
Journal
JOURNAL OF INTELLIGENT MANUFACTURING
Volume 23, Issue 6, Pages 2151-2159
Publisher
Springer Nature
Online
2011-07-23
DOI
10.1007/s10845-011-0561-1

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