Characterization of strongly-bent HAPG crystals for von-Hámos x-ray spectrographs

Title
Characterization of strongly-bent HAPG crystals for von-Hámos x-ray spectrographs
Authors
Keywords
-
Journal
Journal of Instrumentation
Volume 8, Issue 10, Pages P10006-P10006
Publisher
IOP Publishing
Online
2013-10-07
DOI
10.1088/1748-0221/8/10/p10006

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