Sample Thickness Measurement with THz-TDS: Resolution and Implications

Title
Sample Thickness Measurement with THz-TDS: Resolution and Implications
Authors
Keywords
Terahertz time-domain spectroscopy, Far-infrared optical metrology, Silicon, etalon effect, Fabry-Pérot, Phase shift
Journal
Journal of Infrared Millimeter and Terahertz Waves
Volume 35, Issue 10, Pages 840-859
Publisher
Springer Nature
Online
2014-07-15
DOI
10.1007/s10762-014-0093-9

Ask authors/readers for more resources

Reprint

Contact the author

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started