Characterization of interface trap dynamics responsible for hysteresis in organic thin-film transistors

Published 2015 View Full Article

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Title
Characterization of interface trap dynamics responsible for hysteresis in organic thin-film transistors
Authors
Keywords
Organic thin-film transistors, Hysteresis, Interface trap, Characterization
Journal
ORGANIC ELECTRONICS
Volume 27, Issue -, Pages 192-196
Publisher
Elsevier BV
Online
2015-09-28
DOI
10.1016/j.orgel.2015.09.011

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