Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation

Published 2013 View Full Article

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Title
Use of variogram analysis to classify field peas with and without internal defects caused by weevil infestation
Authors
Keywords
-
Journal
JOURNAL OF FOOD ENGINEERING
Volume 123, Issue -, Pages 17-22
Publisher
Elsevier BV
Online
2013-09-12
DOI
10.1016/j.jfoodeng.2013.09.001

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