Journal
JOURNAL OF EXPERIMENTAL NANOSCIENCE
Volume 10, Issue 2, Pages 78-85Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/17458080.2013.788226
Keywords
thin films; electron beam evaporation; XRD analysis; tin sulfide; FTIR analysis
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Funding
- UGC-SAP (University Grants Commission-Special Assistance Programme), New Delhi, India
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SnS nanoparticles were synthesised by the precipitation method using SnCl2.2H(2)O and Na2S.xH(2)O and the nanoparticles were characterised by X-ray diffraction (XRD) and Fourier transform infrared (FTIR) analysis. From the particles' XRD pattern, a strong peak at 2 theta = 31.5 was observed, which confirms the Herzenbergite orthorhombic crystal structure of SnS. The FTIR result also confirmed the SnS nanoparticles at 2354cm(-1) and 615cm(-1). Second, thin SnS films were prepared on a glass substrate by the electron beam evaporation technique at room temperature and annealed at 100 degrees C, 200 degrees C and 300 degrees C. The effect of the annealing temperature on structural and optical properties of the SnS films was characterised by XRD and ultraviolet-visible (UV-Vis) analysis. From the experimental studies, optical absorption of SnS films increases with respect to the annealing temperature, while the values of band gap energy (E-g) get reduced from 1.77 to 1.57eV.
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