4.3 Article

Electrical transport properties of thin film of a-Se87Te13 nanorods

Journal

JOURNAL OF EXPERIMENTAL NANOSCIENCE
Volume 6, Issue 4, Pages 337-348

Publisher

TAYLOR & FRANCIS LTD
DOI: 10.1080/17458080.2010.497946

Keywords

S87Te13 nanorods; physical vapour condensation technique; electrical conduction mechanism; thermally activated process; variable range hopping; Mott's parameters; X-ray diffraction; scanning electron microscopy; transmission electron microscopy

Funding

  1. King Abdul Aziz City for Science and Technology (KAACST), Riyad, Saudi Arabia [ARP-3-17]

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We have studied the electrical transport properties of thin film of a-S87Te13 nanorods. Initially, the glassy alloy of S87Te13 is prepared by melt-quenching technique. The amorphous nature of this alloy is verified by using X-ray diffraction technique. The nanorods of a-S87Te13 are synthesised on a glass substrate under an ambient gas (Ar) atmosphere using physical vapour condensation system. The morphology and microstructure of these nanorods are studied using scanning electron microscopy and transmission electron microscopy. The temperature dependence of dc conductivity for these nanorods is also studied over a temperature range of 500-100 K. On the basis of the temperature dependence of dc conductivity, the conduction mechanism in these nanorods is investigated. The results reveal that the thermally activated process is responsible for the transport of carriers in the temperature range 500-300 K. While the conduction takes place via variable range hopping (VRH) for temperature region 300-100 K. It is therefore, suggested that three-dimensional Mott's variable range hopping (3D VRH) is the conduction mechanism responsible for the transport of charge carriers in the temperature region 300-100 K. Various Mott's parameters such as density of states, degree of disorder, hopping distance and hopping energy are estimated on the basis of best fitting to our experimental data for Mott's 3D VRH model.

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