An RDL UBM Structural Design for Solving Ultralow-K Delamination Problem of Cu Pillar Bump Flip Chip BGA Packaging

Title
An RDL UBM Structural Design for Solving Ultralow-K Delamination Problem of Cu Pillar Bump Flip Chip BGA Packaging
Authors
Keywords
Cu pillar bump, under bump metallurgy, ultralow-<em class=EmphasisTypeItalic >K</em>, delamination, finite element analysis, reliability test
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 43, Issue 11, Pages 4229-4240
Publisher
Springer Nature
Online
2014-08-19
DOI
10.1007/s11664-014-3332-x

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