In Situ Raman Analysis of a Bulk GaN-Based Schottky Rectifier Under Operation

Title
In Situ Raman Analysis of a Bulk GaN-Based Schottky Rectifier Under Operation
Authors
Keywords
-
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 39, Issue 10, Pages 2237-2242
Publisher
Springer Nature
Online
2010-06-16
DOI
10.1007/s11664-010-1304-3

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