Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 39, Issue 6, Pages 819-822Publisher
SPRINGER
DOI: 10.1007/s11664-010-1225-1
Keywords
FTO; spray pyrolysis method; transparent conducting film; electrical resistivity
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Transparent conducting thin films of fluorine-doped SnO(2) (FTO) were deposited on glass substrates by spray pyrolysis. This work studies electron scattering mechanisms of the FTO films through analysis of the temperature-dependent mobility. The mechanisms of lattice vibration and dislocation scattering were not important in the degenerate FTO films. The mean free path was found to be considerably smaller than the grain size, suggesting that ionized impurity and/or neutral impurity scattering are the dominant scattering mechanisms.
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