Quantitative Photoelastic Characterization of Residual Strains in Grains of Multicrystalline Silicon

Published 2010 View Full Article

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Title
Quantitative Photoelastic Characterization of Residual Strains in Grains of Multicrystalline Silicon
Authors
Keywords
-
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 39, Issue 6, Pages 700-703
Publisher
Springer Nature
Online
2010-03-25
DOI
10.1007/s11664-010-1164-x

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