High-Temperature Thermoelectric Characterization of III–V Semiconductor Thin Films by Oxide Bonding

Title
High-Temperature Thermoelectric Characterization of III–V Semiconductor Thin Films by Oxide Bonding
Authors
Keywords
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Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 39, Issue 8, Pages 1125-1132
Publisher
Springer Nature
Online
2010-05-22
DOI
10.1007/s11664-010-1258-5

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