Defect Analysis of Barrier Height Inhomogeneity in Titanium 4H-SiC Schottky Barrier Diodes

Published 2009 View Full Article

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Title
Defect Analysis of Barrier Height Inhomogeneity in Titanium 4H-SiC Schottky Barrier Diodes
Authors
Keywords
-
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 38, Issue 4, Pages 574-580
Publisher
Springer Nature
Online
2009-01-21
DOI
10.1007/s11664-008-0647-5

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