4.5 Article

Synthesis and Characterization of Naphthalene End-Capped Divinylbenzene for OTFT

Journal

JOURNAL OF ELECTRONIC MATERIALS
Volume 38, Issue 9, Pages 2000-2005

Publisher

SPRINGER
DOI: 10.1007/s11664-009-0830-3

Keywords

Field-effect transistor; semiconductor; oxidation stability; mobility

Funding

  1. Information Display R D Center [F0004011-2008-31]
  2. Ministry of Commerce, Industry, and Energy of the Korean Government
  3. Ministry of Knowledge Economy (MKE)
  4. Korea Industrial Technology Foundation (KOTEF)
  5. Korea Evaluation Institute of Industrial Technology (KEIT) [F0004010-2009-32] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
  6. National Research Council of Science & Technology (NST), Republic of Korea [KK-0902-B0, KK-0902] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
  7. National Research Foundation of Korea [과06B1509] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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An organic field-effect transistor was fabricated based on a thin film of 1,4-bis-(2-naphthalen-2-ylvinyl)benzene (BNDV). The organic semiconductor was deposited via thermal evaporation on a chemically modified silicon dioxide surface. The thermal, optical, electronic, and surface properties of the BNDV compound were investigated by thermogravimetric analysis, differential scanning calorimetry, ultraviolet-visible (UV-vis) absorption, photoluminescence spectroscopies, cyclic voltammetry, x-ray diffraction, and atomic force microscopy. The BNDV had good oxidation stability and exhibited a field-effect performance with a mobility of 0.062 cm(2)/V s, a subthreshold slope of 0.4 V, and an on/off ratio of 2.45 x 10(5).

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